A faculty-student research team published findings on the limits of microscopic research. Mechanical Engineering Associate Professor Babak Eslami and student-researcher Dylan Caputo published an article in a special issue of Advances in Surface Modification of the Materials explaining how Atomic Force Microscopy (AFM) is used to measure different types of material properties, including mechanical, electrical, and chemical properties. The findings may provide an alternative way to understand how the material’s elasticity without having to physically test the theory with a hands-on experiment. As the article demonstrates, this technique used with AFM is beneficial as the technology gives scientists a way to understand the material’s properties without increasing the risk of losing important measurements to either humidity or artificial dissipations.

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